Spectrally Process Analytics Roadshow · California · Fall 2026

A one-day, on-site workshop on modern process analytics

A hands-on look at what modern process analyzers can measure directly in your line, how that reading holds up against a lab result, and where to put it so it actually changes a decision. We run it live on the Spectrally X1 INLINE.

Reserve your seat → See what we measure

Los Angeles, CA Oct 29 or 30, 2026 9:00 AM – 1:30 PMFree

Spectrally X1 INLINE analyzer mounted in a process plant — Spectrally X1 INLINE, mounted in a process plant.

Automatic calibrationreference built into the probe, no manual recalibration

High-viscosity mediareads reliably where sediment or thick media coat other probes

Dedicated chemometric modelstrained on your process, not a generic library

Inline measurement, built around your process

The workshop focuses on inline composition measurement in the processes we know best. Find your chemistry below and see what we read directly in the line.

Each measurement is validated and disturbances are compensated automatically, so an operator can act on the reading. Results are delivered to your DCS or PLC over OPC UA or Modbus TCP.

Spectrally optical probe installed on a reactor flange — A retractable tool for an optical probe in high-viscosity process media.

Nitrogen fertilizers

UAN · Urea

Urea and ammonium-nitrate concentration and ratio in UAN, with solution homogeneity.
Batch quality verified inline, with no manual sampling.

EU 2019/1009

Silicones

High-purity PDMS · LSR · vinyl-silicone

D4 / D5 / D6 cyclics against linears, with the cyclic-to-linear distribution.
Si-H and vinyl C=C crosslinking, for cure state and reaction end-point.

EU 2024/1328

Thiosulfates · ATS

Ammonium & potassium thiosulfate

Thiosulfate concentration, N/S ratio and homogeneity, inline.
ATS / KTS / MTS blends checked against spec before shipment.

EU 2019/1009

Coating resins

UPR · Acrylic / VAE · Epoxy

Acid value and esterification end-point in unsaturated polyester resins, inline.
Monomer conversion and copolymer profile in acrylic and VAE emulsions.

VOC 2004/42/EC · REACH 2020/1149

Goal of the workshop

Standard process analyzers vs. modern ones

Most plants already have some kind of process analyzer running the line. Every row on the right is what we show you live, on the instrument.

Standard analyzersModern analyzers

Measurement

One parameter per probe, one calibration curve

→

Multi-component reading — catches deviations and contamination in the same pass

Output

Raw signal or spectrum — someone still has to interpret it

→

Automatic interpretation — a validated number, ready to act on

Field durability

Fouls or gets coated in viscous or sediment-heavy streams

→

Self-cleaning probe — keeps reading in the same media

Environment

Needs a controlled cabinet to run in dusty or ATEX-rated areas

→

Rated to run directly in dust, humidity, vibration, ATEX zones

Footprint

About the size of two old CRT televisions

→

About half a shoebox

Integration

Analog signal, custom wiring to reach the DCS

→

Native OPC UA / Modbus TCP straight into the DCS or PLC

Who you will meet

Science and method

Dr. Karolina Orłowska

Chief Scientific Officer. Leads the technical session and the measurement methodology behind each demonstration.

Hardware and engineering

Dr. Bartosz Kawa

Chief Technology Officer. Responsible for the Spectrally analyzer platform and for inline deployment, from process specification to installed operation.

CEO and US host

Robert Stachurski

Chief Executive Officer of Gekko Photonics. He hosts the US roadshow in person.

Sales and partnerships

Aleksandra Łukasiewicz

Head of International Sales. On site for pilot scope, commercial terms, and next steps for your plant.

Event details

A half-day, on-site session at Los Angeles Trade-Technical College - Process Technology.

Los Angeles Trade-Technical College - Process Technology

400 W Washington Blvd
Los Angeles, CA 90015

Parking on site
1:1 time with our engineers
Lunch provided

Sample workshop agenda

9:00 AMRegistration and coffee

9:30 AMModern process analytics: what you can measure directly in the line today, and how it is validated against the lab

10:15 AMIdentifying the right measurement points: mapping your process to find where a measurement changes a decision

11:00 AMCoffee break

11:15 AMWorking demonstration: reading composition in the line with the Spectrally X1 INLINE on representative media (silicone, UPR, ATS, UAN)

12:00 PMFrom lab method to a validated inline measurement: sampling, calibration, disturbance compensation, and integration to DCS / PLC

12:30 PMLunch and informal discussion

1:00 PM1:1 technical discussion about your process and measurement points

The program is identical on both dates, so pick October 29 or 30, whichever suits you. Seating is limited; we confirm your slot by email once you request it.

Spectrally Process Analytics Roadshow · US · Fall 2026

We run the same one-day, on-site workshop across ten US locations. Each stop is offered on two dates, so you can attend the day that suits you. The program runs 9:00 AM to 1:30 PM. Find the location closest to your site.

NortheastLanghorne, PAOct 5 or 6, 2026→ Ohio ValleyColumbus, OHOct 8 or 9, 2026→ Great LakesJoliet, ILOct 12 or 13, 2026→ SoutheastDallas, NCOct 15 or 16, 2026→ FloridaBartow, FLOct 19 or 20, 2026→ Gulf Coast · LouisianaGonzales, LAOct 22 or 23, 2026→ Gulf Coast · TexasPasadena, TXOct 26 or 27, 2026→

CaliforniaThis stopLos Angeles, CAOct 29 or 30, 2026

Pacific NorthwestScappoose, ORNov 2 or 3, 2026→ Northern CaliforniaFairfield, CANov 5 or 6, 2026→

Reserve your seat

Leave your email and let us know if you can make it — we’ll confirm your seat and send the venue details and agenda. If neither date works, choose No or Maybe and we’ll be in touch, including about our 5-day analytical measurement efficiency audit.